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Dong-Eun Kim 1 Article
Measurement of High Temperature Dielectric Property at Microwave Frequency Using Cavity Perturbation Method
Dong-Eun Kim, Jin-Ho Jung, Sung-Min Lee, Hyung-Tae Kim
J Korean Powder Metall Inst. 2006;13(6):455-461.
DOI: https://doi.org/10.4150/KPMI.2006.13.6.455
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AbstractAbstract PDF
High temperature dielectric constants of the various ceramic materials have been measured using cavity perturbation method. The measurements were applied to refractory, traditional and fine ceramic powder compacts from room temperature to 1200°C. Calibration constant in the equation suggested by Hutcheon et al., was determined from the dielectric constants of reference specimen (teflon and alumina) at room temperature. From these results, informations on the refectory materials were obtained for the microwave kiln design and understanding of the microwave heating effects of ceramics have been improved.

Citations

Citations to this article as recorded by  
  • Dielectric Properties of β-SiAlON at High Temperature Using Perturbation Method
    Young Hoon Seong, Ha Neul Kim, Do Kyung Kim
    Key Engineering Materials.2008; 403: 121.     CrossRef

Journal of Powder Materials : Journal of Powder Materials